UES, Inc. has an opportunity available for a Scientist or Engineer, specializing in Focused Ion Beam (FIB) Applications Development, to join our team working at Wright Patterson Air Force Base in Dayton, OH. The Scientist or Engineer will take leadership of FIB/SEM applications development by creating efficient solutions to make mission critical process decisions with the use of expertly crafted workflows and automation on dual beam FIB/SEM systems. This ideal candidate will exhibit a broad spectrum of expertise in FIB/SEM/TEM instrumentation, TEM specimen preparation, serial slice and view / tomography, EDS, EBSD, high-resolution and advanced imaging and analytical techniques for ion, electron, and x-ray instrumentation. Essential duties include:
Develop, characterize, and document advanced applications to expand and automate dual beam microscope functionality. Provide technical product expertise, conduct customer training, and translate customer needs into useful solutions. Actively seek new technologies to advance/augment existing analytical capabilities. Preparation of micro-tensile testing samples by FIB, mechanical and laser ablation techniques, conduct in-situ experiments in FIB/SEM/TEM and ex-situ testing when needed. Automate applications and instrument operation by using tools such as Python/Machine Learning. Champion positive customer relationships and act as a high-level customer interface for specific instrument/applications issues, explaining technology details, giving in depth technical presentations, and assisting them in applications development. Provide continuous feedback to user groups on system performance, features through documentation, seminars, and workshops. Develop collaborations with existing customers, identify and develop collaborative efforts with new customers and work with marketing/development groups on future application developments.
Requirements:
BS, MS, or PhD in chemistry, physics, material science or related field. Familiarity with range of characterization techniques, XRD, FIB, SEM, TEM, EDS, EBSD, micro/nano X-ray CT, preferred. Experience working in a formal laboratory setting considering general safety, lab supplies, and chemicals for material preparation. Knowledge of conventional metallography, sample preparation for electron, optical microscopy. Excellent verbal and written communication skills. This position is working within a government facility and requires U.S. Citizenship.
Additional Information
UES, Inc. is an innovative science and technology company providing customers with superior research and development expertise since its inception in 1973. Our long-term success is a direct result of a strong commitment to the success of our employees. We look forward to reviewing your application.
UES, Inc. is committed to hiring and retaining a diverse workforce. We are proud to be an Equal Opportunity/Affirmative Action Employer, making decisions without regard to race, color, religion, creed, sex, sexual orientation, gender identity, marital status, national origin, age, veteran status, disability, or any other protected class. U.S. Citizenship is required for most positions.