Publications
1. Mei-Jiau, H., Tien-Yao, C., Heng-Chieh, C., Wei-Che, S. & Da-Jeng, Y. "The Thickness Difference Method for Measuring the Thermal Conductivity of Thick Films," Microelectromechanical Systems, Journal of, vol. 19, pp. 895-902, 2010.
2. Wei-Che, S., Mei-Jiau, H., Heng-Chieh, C., Tien-Yao, C. & Da-Jeng, Y. "A novel method for measuring thick film thermal conductivity," in Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on, 2010, pp. 1052-1056.
3. Hsu, C.-C., Hsu, P.-F., Sun, W.-C., Yao, D.-J. & Wang, W.-H. "Process Control of In2O3-ZrO2-SiO2 Interface Layer to Improve DOW Characteristic of Blu-ray Rewritable Media," presented at the Asia-Pacific Data Storage Conference, 2010.
4. W.C.,Sun, Y.R.,Huang, Y.C.,Huang, H.C.,Chien., T.E.,Hsieh, D.J.,Yoa "Measurment thermal conductivity for Ge2Sb2Te5 phase-change memory material," in Nano and Microsystem Technology, 2010.