Publications
- M. Nowak, Photoferroelectric nanowires; invited chapter in the book: Nanowires Science and Technology, Edited by Nicoleta Lupu, Published by INTECH, Publishing date: February 2010, ISBN 978-953-7619-89-3, pp. 269-308 (Available from: http://www.intechopen.com/articles/show/title/photoferroelectric-nanowires )
- M. Nowak, "Photoelectromagnetic Effect in Semiconductors and its Applications", Progress in Quantum Electronics, vol. 11, No 3/4 (1987) pp. 205-346.
- M. Nowak, P. Szperlich, Ł. Bober, J. Szala, G. Moskal, D. Stróż, Sonochemical Preparation of SbSI Gel, Ultrasonics Sonochemistry 15 (2008) 709–716.
- A. Starczewska, R. Wrzalik, M. Nowak, P. Szperlich, Ł. Bober, J. Szala, D. Stróż, D. Czechowicz, Infrared spectroscopy of ferroelectric nanowires of antimony sulfoiodide, Infrared Physics & Technology 51 (2008) 307-15.
- P. Szperlich, M. Nowak, Ł. Bober, J. Szala, D. Stróż, Ferroelectric properties of ultrasonochemically prepared SbSI ethanogel, Ultrasonics Sonochemistry 16 (2009) 398–401
- A. Starczewska, R. Wrzalik, M. Nowak, P. Szperlich, M. Jesionek, G. Moskal, T. Rzychoń, J. Szala, D. Stróż, P. Maślanka, Influence of the solvent on ultrasonically produced SbSI nanowires, Ultrasonics Sonochemistry 16 (2009) 537–545;
- M. Nowak, B. Kauch, P. Szperlich, M. Jesionek, M. Kępińska, Ł. Bober, J. Szala, G. Moskal, T. Rzychoń, D. Stróż, Sonochemical Preparation of SbSeI Gel, Ultrasonics Sonochemistry 16 (2009) 546–551
- M. Nowak, B. Kauch, P. Szperlich, Determination of energy band gap of nanocrystalline SbSI using diffuse reflectance spectroscopy, Review of Scientific Instruments 80 (2009) 046107-1-3.
- M. Nowak, M. Jesionek, P. Szperlich, J. Szala, T. Rzychoń, D. Stróż, Sonochemical growth of antimony sulfoiodide in multiwalled carbon nanotube, Ultrasonics Sonochemistry 16 (2009) 800-804.
- M. Nowak, E. Talik, P. Szperlich, D. Stróż, XPS analysis of sonochemically prepared SbSI ethanogel, Applied Surface Science 255 (2009) 7689–7694.
- M. Nowak, P. Szperlich, E.Talik, J. Szala, T. Rzychoń, D. Stróż, A. Nowrot, B. Solecka, Sonochemical preparation of antimony subiodide, Ultrasonics Sonochemistry 17 (2010) 219-227.
- M. Nowak, B. Kauch, P. Szperlich, D. Stróż, J. Szala, T. Rzychoń, Ł. Bober, B. Toroń, A. Nowrot, Sonochemical preparation of SbS1-xSexI nanowires, Ultrasonics Sonochemistry 17 (2010) 487–493.
- M. Nowak, M. Kotyczka-Morańska, P. Szperlich, Ł. Bober, M. Jesionek, M. Kępińska, D. Stróż, J. Kusz, J. Szala, G. Moskal, T. Rzychoń, J. Młyńczak, K. Kopczyński, Using of sonochemically prepared components for vapor phase growing of SbI3•3S8, Ultrasonics Sonochemistry 17 (2010) 892–901
- D. Stróż, M. Nowak, M. Jesionek, K. Bałdys, Structure of antimony sulfoiodide ultrasonically prepared in carbon nanotubes, Solid State Phenomena Vol. 163 (2010) pp 88-92
- M. Kępińska, M. Nowak, P. Duka, B. Kauch, Spectrogoniometric determination of refractive indices of GaSe, Thin Solid Films 517 (2009) 3792–3796.
- M. Nowak, P. Mroczek, P. Duka, A. Kidawa, P. Szperlich, A. Grabowski, J. Szala, G. Moskal, Using of textured policrystalline SbSI in actuators, Sensors and Actuators A 150 (2009) 251–256.
- M.Szałajko, M. Nowak, Quantum efficiency coefficient for photogeneration of carriers in gallium sulphide single crystals. Journal of Physics: Condensed Matter 19 (2007) 196210
- M.Szałajko, M. Nowak. The influence of light intensity on surface recombination in GaS monocrystals, Applied Surface Science 253 (2007) 3636-364
- A. Michalewicz, M. Nowak and M. Kępińska, Differences between surface and bulk refractive indices of a-InxSe1−x , Applied Surface Science 252 (2006) 7743-7747
- A. Michalewicz, M. Nowak, M. Kępińska, Temperature dependence of the energy gap of InxSe1-x compounds, physica status solidi (b) 243 (Issue 3) (2006) 685-9
- M. Nowak, A. Starczewska, Steady-state photocarrier grating method of determining electronic states parameters in amorphous semiconductors, Journal of Non-Crystalline Solids 351 (2005) 1383-92
- A. Grabowski, M. Nowak, J. Śleziona, Optical and conductive properties of AlSi-alloy/SiCp composites: application in modelling CO2 laser processing of composites, Optics and Lasers in Engineering 43 (2005) 233-246.
- M. Kępińska, R. Murri, M. Nowak, Surface and bulk values of real part of refractive index of GaSe; Vacuum, vol. 67 (2002) 143-147.
- M. Kępińska, M. Nowak, Z. Kovalyuk, R. Murri, Temperature dependence of optical energy gap of gallium selenide, Journal of Wide Bandgap Materials, vol. 8, no 3-4 (2001) 251-259.
- M. Kępińska, M. Nowak, M. Szałajko, R. Murri, Temperature dependence of optical parameters of gallium sulphide, Journal of Wide Bandgap Materials, vol. 8, no 3-4 (2001) 241-249.
- M. Nowak, B. Solecka, Application of high-frequency contactless method of PEM investigations to examine near-surface layer of Si and GaAs, Vacuum 57 (2000) 237-242.
- M. Nowak, A. Starczewska, Influence of spatial distribution of radiation on steady-state photocarrier grating measurement, Journal of Non-Crystalline Solids 260 (1999) 41-53
- A. Grabowski, J. Jaglarz, M. Nowak, Angular distribution of reflected radiation investigations of the influence of CO2 laser treatment on optical properties of hydrogenated amorphous silicon, Optics & Laser Technology 30 (1998) 183-187.
- V. Augelli, M. Nowak, Distribution of radiation intensity in a thin semiconductor film on a thick substrate, Thin Solid Films 338 (1999) 188-196.
- J. Jaglarz, M. Nowak, Investigations of spatial distributions of intensity of radiation reflected from thin films which are inhomogeneous over thickness, J. Modern Optics 45 No. 12 (1998) 2451-2460.
- J. Jaglarz, M. Nowak, New technique of VAR investigations of thin films on thick substrates, NDT&E International (Independent Nondestructive Testing and Evaluation) ) vol. 31 no 5 (1998) 341-347.
- M. Kępińska, M. Nowak, Comparison of optical constants and average thickness of inhomogeneous rough thin films obtained from special dependences of optical transmittance and reflectance, NDT&E International (Independent Nondestructive Testing and Evaluation) vol. 31 no 2 (1998) 105-110.
- A. Grabowski, M. Nowak, P. Tzanetakis, Determination of recombination and photogeneration parameters of a-Si:H using photoconductivity measurements, Thin Solid Films 283 (1996) s. 75-80.
- J. Jaglarz, M. Nowak, Determination of optical constants and average thickness of thin films on thick substrates using angular distribution of intensity of reflected radiation, Thin Solid Films 278 (1996) pp. 124-128.
- B. Loncierz, R. Murri and M. Nowak, Determining carrier lifetime using frequency dependence in contactless photoelectromagnetic investigations of semiconductors, Thin Solid Films 266 (1995) 274-277.
- G.J. Papaioannou, M. Nowak, P.C. Euthymiou, Influence of illumination intensity on negative photoconductivity of Si ion-implanted GaAs:Cr, J.Appl.Phys. 65 (1989) p. 4864-4868.
- V. Augelli, R. Murri, M. Nowak, Interference photoconductivity and photoelectromagnetic effect in amorphous silicon, Phys. Rev. B 39 (1989) p. 8336-8346.
- K. Jóźwikowski, M. Nowak and J. Piotrowski, Interference photoelectromagnetic effect in graded-gap semiconductrors, Infrared Phys. 24(4) (1984) p. 371-380.
- M. Nowak, The possible existence of the interference photomagnetoelectric effect, Phys.Stat.Sol. A74(1) (1982) 313-322.
- M. Nowak, The dependence of the photomagnetoelectric effect on the angle of incidence of radiation, Phys.Stat.Sol. A74(2) (1982) p. 603-613.
- M. Nowak, Oscillatory dependence of the interference photomagnetoelectric effect and photoconductivity on magnetic field, Phys.Stat.Sol. A82(1) (1984) p. 249-256.
- M. Nowak, The photomagnetoelectric effect and photoconductivity for non-normal incidence of radiation, Phys.Stat.Sol. A80(2) (1983) p. 691-702.
- M. Nowak, Thin-film photoelectromagnetic detectors for infrared radiation, Infrared Phys. 23(1) (1983) p. 35-42.
- M. Nowak, Dependences of photomagnetoelectric effect and photoconductivity on magnetic field due to the change of semiconductor refractive index, Acta Physica Polonica A67 (2) (1985) p. 417-420.
- M. Nowak, Distribution of radiation intensity in a semiconductor film, Optical Engineering vol. 33 No. 5 (1994) 1501-1510.
- M. Nowak, Determination of optical constants and average thickness of inhomogeneous-rough thin films using spectral dependence of optical transmittance, Thin Solid Films vol. 254 (1995) 200-210.
- M. Nowak, Linear distribution of intensity of radiation reflected from and transmitted through a thin film on a thick substrate, Thin Solid Films 266 (1995) 258-262,
- M.Nowak, S.Kończak and F.Madaj, Some comments on the anomalous photo magnetoelectric effect, Phys.Stat.Sol. A72(2) (1982) p. 503-509.
- M. Nowak, S. Łoś and S. Kończak, Refractive index of silicon oxide surface films determined by polarization method of photomagnetoelectric investigation, Surface Sci. 140 (2) (1984) p. 446-454.
- M. Nowak and H. Polakowski, Dead temperature of the photoelectromagnetic detectors for infrared radiation, Infrared Phys. 24(5) (1984) p. 483-484.
- S. Kończak and M. Nowak, Some comments on the photomagnetoelectric effect, Surface Sci. 87 , 228-238 (1979).
- A. Kidawa and M. Nowak, Some comments on polycrystalline SbSI, Materials Science and Engineering 46 125-127 (1980).
- S. Kończak and M. Nowak, The estimation of semiconductor parameters using least squares in photomagnetoelectric investigations, Phys.Stat.Sol. A63 , 305-311 (1981).
- S.Kończak, K. Kotewicz and M. Nowak, High-frequency photomagnetoelectric method for determining semiconductor parameters, Phys.Stat.Sol. A65 (1981) 447-451.
