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Rostislav V. Lapshin

Solid Nanotechnology Laboratory
Institute of Physical Problems


• scanning tunneling microscopy
• atomic-force microscopy
• scanning probe microscopy
• optical profilometry
• infrared microscopy
• high capacity probe storage
• nanometrology
• automatic surface characterization
• nanolithography
• nanomanipulation
• nanoassembling
• bottom-up nanofabrication
• molecular manufacturing
• nanotechnology
• catalytic nanoparticles
• micromechanical bimaterial infrared detectors


• Preparation of catalytic nickel nanoparticles on a smooth substrate
• Micromechanical bimaterial IR-detectors
• Miniature “walker” type robot-nanopositioner
• Polymer surface treatment in vacuum ultraviolet
• Drift-insensitive distributed calibration of probe microscope scanner
• Drift elimination based on counter-scanned images
• Feature-oriented scanning
• Feature-oriented positioning

see details at


• R. V. Lapshin, STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite, Applied Surface Science, 2015 (in press).
• R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015.
• R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, vol. 4, no. 1, pp. 1-11, 2010.
• R. V. Lapshin, Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition, Measurement Science and Technology, vol. 18, iss. 3, pp. 907-927, 2007.
• R. V. Lapshin, Feature-oriented scanning methodology for probe microscopy and nanotechnology, Nanotechnology, vol. 15, iss. 9, pp. 1135-1151, 2004.
• R. V. Lapshin, Object-oriented scanning for probe microscopy and nanotechnology, Ph. D. thesis (in Russian), Moscow, 2002.
• R. V. Lapshin, Digital data readback for a probe storage device, Review of Scientific Instruments, vol. 71, no. 12, pp. 4607-4610, 2000.
• R. V. Lapshin, Automatic lateral calibration of tunneling microscope scanners, Review of Scientific Instruments, vol. 69, no. 9, pp. 3268-3276, 1998.
• R. V. Lapshin, Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope, Review of Scientific Instruments, vol. 66, no. 9, pp. 4718-4730, 1995.
• R. V. Lapshin, O. V. Obyedkov, Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes, Review of Scientific Instruments, vol. 64, no. 10, pp. 2883-2887, 1993.

see complete list & full texts of the articles at
Grade: Member

Member since June 16, 2011
Contact Details
Address: 5 Georgievskiy Avenue, Zelenograd, Moscow, 124460, Russian Federation
Phone: +7 (499) 731-9843
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